SURFAMET
Surface Analysis Measurements & Training Services
Dr. Filippo Mangolini earned his Ph.D. in Materials Science at the Swiss Federal Institute of Technology (ETH Zurich, Zurich, Switzerland) in 2011, after graduating from Polytechnic University of Milan (Milan, Italy) in Materials Engineering with the highest honor in 2006. Upon completion of his Ph.D. in 2011, Dr. Mangolini performed postdoctoral research at the University of Pennsylvania and then at Ecole Centrale de Lyon (Lyon, France). His postdoctoral research was supported by the European Union through a Marie Curie International Outgoing Fellowship and by the Swiss National Science Foundation (SNSF) through an SNSF Postdoctoral Fellowship. After two years at the University of Leeds (Leeds, UK) as a University Academic Fellow and Marie Curie Fellow, Dr. Mangolini joined the faculty of the Walker Department of Mechanical Engineering at The University of Texas at Austin in Spring 2018 as an Assistant Professor in Materials Science and Engineering. In Fall 2020 he was appointed as a Walker Scholar.
Dr. Mangolini has received a number of international and national awards and honors for outstanding research and teaching achievements, including the 2022 American Society of Mechanical Engineers (ASME) Burt L. Newkirk Award, 2021 NSF CAREER Award, 2021 Society of Tribologists and Lubrication Engineers (STLE) Early Career Award, 2020 Dean’s Award for Outstanding Engineering Teaching by an Assistant Professor, 2020 Teaching award from the Walker Department of Mechanical Engineering, 2018 Ralph E. Powe Junior Faculty Enhancement Award, and the 2016 Mazzucotelli Award from the Italian Chemical Society.
Since his graduate studies, Dr. Mangolini used and extended surface-analytical approaches for the evaluation of the physico-chemical processes occurring on solid surfaces and at solid/liquid interfaces. This required the employment of state-of-the-art analytical tools, including X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), atomic force microscopy (AFM), near-edge X-ray absorption fine structure (NEXAFS) spectroscopy, Fourier-transform infrared spectroscopy, and Raman spectroscopy. He has an extensive publishing record on the use of these advanced surface characterization techniques for fundamental and applied studies.