XPS Data Acquisition & Basic Methods for XPS Data Processing

XPS Data Acquisition & Basic Methods for XPS Data Processing

The goal of the 2-day course is to introduce attendees to the best practices for acquiring XPS data and expose them to basic methods for processing XPS data. Specific topics include:

1. Calibration of XPS systems

2. Procedures for checking the performance of XPS instruments

3. Determination of the lateral resolution of XPS systems

4. Practical guidelines for XPS data collection

5. Large- and small-spot size XPS analyses

6. Imaging XPS analyses

7. Interpretation of XPS survey spectra

8. Qualitative XPS analyses

9. Background subtraction in high-resolution XPS spectra

10. Fitting high-resolution XPS spectra

11. Quantitative analysis of homogeneous materials

12. First-principles calculation of sensitivity factors