Advanced Methods for XPS Analysis & Data Processing
The goal of the 1-day course is to introduce attendees to advanced methods for processing XPS data. Specific topics include:
XPS spectromicroscopy analysis
Angle-resolved XPS (AR-XPS)
Background subtraction in high-resolution XPS spectra
Fitting high-resolution XPS spectra
Quantitative analysis of multi-layered materials
First-principles calculation of sensitivity factors
Simulation of XPS spectra of multi-layered thin films
Simulation of XPS spectra of films with complex morphology
Ultraviolet photoelectron spectroscopy (UPS)