Advanced methods for XPS analysis & data processing

Advanced Methods for XPS Analysis & Data Processing

The goal of the 1-day course is to introduce attendees to advanced methods for processing XPS data. Specific topics include:

1. XPS spectromicroscopy analysis

2. Angle-resolved XPS (AR-XPS)

3. Background subtraction in high-resolution XPS spectra

4. Fitting high-resolution XPS spectra

5. Quantitative analysis of multi-layered materials

6. First-principles calculation of sensitivity factors

7. Simulation of XPS spectra of multi-layered thin films

8. Simulation of XPS spectra of films with complex morphology

9. Ultraviolet photoelectron spectroscopy (UPS)